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Beam Diagnostics in Superconducting Accelerating Cavities [electronic resource] : The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes / by Pei Zhang.

Por: Tipo de material: TextoTextoSeries Springer Theses, Recognizing Outstanding Ph.D. Research | Springer Theses, Recognizing Outstanding Ph.D. ResearchEditor: Cham : Springer International Publishing : Imprint: Springer, 2013Descripción: XII, 118 p. 180 illus., 40 illus. in color. online resourceTipo de contenido:
  • text
Tipo de medio:
  • computer
Tipo de soporte:
  • online resource
ISBN:
  • 9783319007595
Trabajos contenidos:
  • SpringerLink (Online service)
Tema(s): Formatos físicos adicionales: Sin títuloClasificación CDD:
  • 539.73 23
Clasificación LoC:
  • QC770-798
Recursos en línea:
Contenidos:
Springer eBooksResumen: This workemploys self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodologyis carefully explainedmaking the presentation pedagogically appropriate to students new to the field as well asresearchers familiar with this topic.Pei Zhang'sachievementswill serve as a basis for the development of similar monitors at various other facilities around the world.
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Electromagnetic Eigenmode Simulations of the Third Harmonic Cavity -- Measurements of HOM Spectra -- Analysis Methods for Beam Position Extraction from HOM -- Dependencies of HOM on Transverse Beam Offsets -- HOM-Based Beam Position Diagnostics.

This workemploys self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodologyis carefully explainedmaking the presentation pedagogically appropriate to students new to the field as well asresearchers familiar with this topic.Pei Zhang'sachievementswill serve as a basis for the development of similar monitors at various other facilities around the world.

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