Applied Scanning Probe Methods IV [electronic resource] : Industrial Applications / edited by Bharat Bhushan, Harald Fuchs.
Tipo de material: TextoSeries NanoScience and Technology | NanoScience and TechnologyEditor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Descripción: XLIV, 284 p. online resourceTipo de contenido:- text
- computer
- online resource
- 9783540269144
- SpringerLink (Online service)
Contenidos:
Springer eBooks
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Scanning Probe Lithography for Chemical, Biological and Engineering Applications -- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) -- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography -- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography -- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) -- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection -- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices -- Applications of Heated Atomic Force Microscope Cantilevers.
ZDB-2-CMS
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