Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs.
Tipo de material: TextoSeries NanoScience and Technology | NanoScience and TechnologyEditor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009Descripción: online resourceTipo de contenido:- text
- computer
- online resource
- 9783540850373
- SpringerLink (Online service)
Contenidos:
Springer eBooks
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Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
ZDB-2-CMS
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