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VLSI-SoC: Advanced Research for Systems on Chip [electronic resource] : 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, Hong Kong, China, October 3-5, 2011, Revised Selected Papers / edited by Salvador Mir, Chi-Ying Tsui, Ricardo Reis, Oliver C. S. Choy.

Por: Colaborador(es): Tipo de material: TextoTextoSeries IFIP Advances in Information and Communication Technology ; 379 | IFIP Advances in Information and Communication Technology ; 379Editor: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012Descripción: X, 190 p. online resourceTipo de contenido:
  • text
Tipo de medio:
  • computer
Tipo de soporte:
  • online resource
ISBN:
  • 9783642327704
Trabajos contenidos:
  • SpringerLink (Online service)
Tema(s): Formatos físicos adicionales: Sin títuloClasificación CDD:
  • 004 23
Clasificación LoC:
  • QA75.5-76.95
  • TK7885-7895
Recursos en línea:
Contenidos:
Springer eBooksResumen: This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, held in Hong Kong, China, in October 2011. The 10 papers included in the book were carefully reviewed and selected from the 45 full papers and 16 special session papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.
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This book contains extended and revised versions of the best papers presented at the 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, held in Hong Kong, China, in October 2011. The 10 papers included in the book were carefully reviewed and selected from the 45 full papers and 16 special session papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

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