VLSI Design and Test [electronic resource] : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers / edited by Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, Adit D. Sing.
Tipo de material:
TextoSeries Communications in Computer and Information Science ; 382 | Communications in Computer and Information Science ; 382Editor: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Descripción: XVI, 388 p. 246 illus. online resourceTipo de contenido: - text
- computer
- online resource
- 9783642420245
- SpringerLink (Online service)
- 004 23
- QA75.5-76.95
- TK7885-7895
Contenidos:
Springer eBooksResumen: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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VLSI design -- Testing and verification -- Embedded systems -- Emerging technology.
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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